Description
ACCRETECH E-DT-LM-S30
High-precision laser displacement detector for semiconductor wafer metrology and thin film stress measurement applications
| Brand | ACCRETECH |
| Model | E-DT-LM-S30 |
| Voltage | 24V DC |
| Country of Origin | China |
| Weight | 0.8 kg |
| Dimensions | 85x60x120 mm |
| Warranty | 6 months |
| Certifications | CE, RoHS |
| SKU / MPN | E-DT-LM-S30 |
| What’s in the box | Laser detector head, mounting bracket, calibration certificate, user manual, connection cables |
| Measurement Range | ±0.5 mm |
| Resolution | 0.01 μm |
| Linearity | ±0.05% F.S. |
| Response Time | 1 ms |
| Output Signal | Analog 4-20 mA / RS-485 |
| Operating Temperature | 10°C to 40°C |
Key benefits: Ultra-high resolution, non-contact measurement, excellent repeatability, compact design for cleanroom integration, fast response time
Typical applications: Wafer bow and warp measurement, film stress analysis, surface topography inspection, semiconductor fab quality control
Lifecycle: Active product, 8+ years availability
Our Advantages
Exact match for many brands
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Guaranteed for one full year
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